- Department Shared Instrument
- EPS Department Shared Car (EPS Internal)
- Facility / Rooms (UT Internal)
- Fieldwork Equipment (UT Internal)
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EPS Department Shared Instrument
About EPS Department Shared Instrument
EPS Department maintains instrument such as analytical devices with especially high commonality. As of April 2014, we possess following 9 devices (detailed descriptions are given under each item). Contact the manager of respective device for details.
Eligibility for Use
Any student (including both undergraduate courses), faculty members and researchers belonging EPS Department are elibigle for using the following devices, but be reminded a certain level of training is needed for self-use (with some exceptions). Students, faculty members and researchers of other department can also be eligible for instrument use, but contact instrument managers for details.
Cost for Use
Fee is incurred on either individuals or laboratory for using EPS Department shared equipment and requesting managers for operation. If students and researchers are to use shared equipment, ensure that they consult with faculty of each laboratory. Contact equipment managers for fee or cost of using each device.
| Inst.# | Instrument | Manager | Extension | Email* |
| 1 | X-ray Powder Diffractometer for Multi-sample Measurement (XRD) | Akihiro Kobayashi | 24557 | akobayashi |
| 2 | X-ray Powder Diffractometer (XRD) | Koji Ichimura | 24557 | ichimura |
| 3 | High Resolution Field Emission-Scanning Electron Microscope (FE-SEM) | Koji Ichimura | 24557 | ichimura |
| 4 | Field Emission-Scanning Electron Microscope (FE-SEM) | Hideto Yoshida | 24528 | yoshida |
| 5 | Electron Probe Micro Analyzer (EPMA) | Hideto Yoshida | 24528 | yoshida |
| 6 | Electron Probe Micro Analyzer (FE-EPMA) | Koji Ichimura | 24557 | ichimura |
| 8 | Stable Isotope Ratio Mass Spectrometer (IS-MS) | Akihiro Kobayashi | 24557 | akobayashi |
| 9 | Laser Ablation-Plasma Ion Source Mass Spectrometer (LA-ICPMS) | Akihiro Kobayashi | 24557 | akobayashi |
* Add @eps.s.u-tokyo.ac.jp after “Email”.
X-ray Powder Diffractometer for Multi-sample Measurement (XRD)
Instrument # 1
Instrument: X-ray Powder Diffractometer for Multi-sample Measurement, PANalytical X’Pert Pro MPD
Location: “X-ray Laboratory”, B141, Centeral Bldg., Faculty of Science Bldg.1
Principle and Features: X-ray powder diffractometer is used for identification and amount of minerals contained in the sample by radiating X-ray to powder sample and measuring the intensity of diffracted X-ray at each angle. This device is equipped with a mechanism that can automatically load up to 45 samples at one time.
Manager: Akihiro Kobayashi Tel: 24557 akobayashi[@]eps.s.u-tokyo.ac.jp
X-ray Powder Diffractometer (XRD)
Instrument # 2
Instrument: X-ray Powder Diffractometer, Rigaku RINT-2100
Location: “X-ray Laboratory”, B141, Centeral Bldg., Faculty of Science Bldg.1
Principle and Features:
Principle and Features: This is an analytical devide that measures X-ray diffraction pattern of minerals, and enables following analyses.
(1) Identifies materials by comparing known X-ray diffraction pattern
(2) Differentiates materials with the same chemical composition but different structure
(3) Analyses constituent phase
(4) Identifies structure of unknown substance by combining Rietveld Method and Direct Method
This system possesses X-ray powder database of natural and synthesized material, and enables computer searching from X-ray diffraction pattern obtained from experiments.
Manager: Koji Ichimura Tel: 24557 ichimura[@]eps.s.u-tokyo.ac.jp
High Resolution Field Emission-Scanning Electron Microscope (FE-SEM)
Instrument # 3
Instrument: High Resolution Field Emission-Scanning Electron Microscope, Hitachi S-4500
Location: “Scanning Electron Microscope Room”, B238, Centeral Bldg., Faculty of Science Bldg.1
Principle and Features: This is a field emission scanning electron microscope (SEM) equipped with cold (cathode) field-emission electron gun, and is capable of capturing images with resolution of ~5nm thanks to high-brighteness beam and low energy band. This SEM can obtain various information from samples. (1) upper secondary electron detector (2) lower secondary electron detector (3) high sensitivity backscattered electron (BSE) detector (4) Energy-dispersive X-ray (EDS) detector (5) two dimensional electron backscatter diffraction (EBSD) detector (6) forescatter electron (FSE) detector
Manager: Koji Ichimura Tel: 24557 Tel: 24557 ichimura[@]eps.s.u-tokyo.ac.jp
Analytical Field Emission-Scanning Electron Microscope (FE-SEM)
Instrument # 4
Instrument: Field Emission-Scanning Electron Microscope, JEOL JSM-7000F
Location: “Scanning Electron Microscope Room”, B238, Centeral Bldg., Faculty of Science Bldg.1
Principle and Features: The field emission scanning electron microscope (FE-SEM) is a device for capturing facial information such as the surface condition, shape, and density of an electron, by irradiating the sample with electron beams in a high vacuum, scanning the surface of the sample and capturing the generated secondary electrons and backscattered electrons with a detector. It is mainly used for observing the microstructure of rocks and minerals. By using an energy dispersive spectrometer together, it is possible to know the local or two-dimensional distribution of multiple elements. In addition, backscattered electron (BSE) diffraction detector is a device that can determine the orientation of a crystal at a nano-scale level. This device is applied to clarifying structural and chemical characteristics of samples of Earth, planets and meteorites, or substances synthesized by experiments, as it can obtain chemical, rock, and mineral structural information at nano-scale. This device was introduced in April 2005, and is mainly used for promoting projects funded by Grant-in-Aid for Scientific Research.
Manager: Hideto Yoshida Tel: 24528 yoshida[@]eps.s.u-tokyo.ac.jp
Electron Probe Micro Analyzer (EPMA)
Instrument # 5
Equipment Name: EPMA (Electron Probe Micro Analyzer), JEOL JXA-8900L
Location: “EPMA Analysis Room”, B136, Centeral Bldg., Faculty of Science Bldg.1
Principle and Features: EPMA radiates 1 micron electron beam on samples, detects characteristic X-ray generated by interaction between the solid surface and electrons, and enables multi-dimensional analysis of the sample by obtaining types, content and distribution of constituents without destroying the sample. This device is equipped with five wavelength dispersive X-ray detectors (WDS) for each device, and one is also equipped with an energy dispersive X-ray detector (EDS). Using composition information obtained from extremely small section of the sample also clarifies information on material evolution such as crystal growth in magma and the formation of solid materials in outer space. It is also used for the evaluation of materials science.
Manager: Hideto Yoshida Tel: 24528 yoshida[@]eps.s.u-tokyo.ac.jp
Electron Probe Micro Analyzer (FE-EPMA)
Instrument # 6
Equipment: Electron Probe Micro Analyzer (FE-EPMA), JEOL JXA-8530F
Location: “EPMA Analysis Room”, B136, Centeral Bldg., Faculty of Science Bldg.1
Principle and Features: Electron Probe Micro Analyzer (EPMA) enables non-destructive nano-scale elemental analysis of the sample by radiating 1 micron probe-diameter electron beam on samples, and measuring the wavelength and intensity of the generated characteristic X-ray. In addition, the FE-EPMA equipped with a field emission (FE) electron gun enables measurement in the submicrometer range. This device has 10 spectral crystals installed in 5 channels which realizes accurate and prompt elemental analysis. Further, a backscattering / transmitting illumination device, a secondary electron detector / backscattered electron detector, an energy dispersive X-ray analyzer (EDS), and a panchromatic (three-color filters attachable) type cathode luminescence detector are also installed, and therefore the optimum analysis position can be searched efficiently and effectively. It has a spectroscopic cathode luminescence measurement system as well.
Manager: Koji Ichimura Tel: 24557 ichimura[@]eps.s.u-tokyo.ac.jp
Stable Isotope Ratio Mass Spectrometer
Instrument # 8
Equipment: Stable Isotope Ratio Mass Spectrometer, Finnigan MAT252
Location: “Mass Spectrometry Laboratory”, B137, Centeral Bldg., Faculty of Science Bldg.1
Principle and Features: Stable isotope ratio mass spectrometer enables the measurement of stable isotope ratios (2H / 1H, 13C / 12C, 18O / 16O) of hydrogen, carbon, and oxygen contained in various geological, environmental, and biological samples. This device obtains information on the origin of the sample and the formation / diagenesis process by analyzing the measured stable isotope ratio. This device ionizes a gasified sample by thermions, accelerates the generated isotope ions in a vacuum by an electric field, divides them by mass by a magnetic field, and measures their abundance ratio. The oxygen / carbon stable isotope ratio of carbonate samples can be measured manually for each sample, or by connecting an automatic carbonate pretreatment device (Kiel III), or a trace amount (70 micrograms) of up to 30 samples can be automatically measured.
Manager: Akihiro Kobayashi Tel: 24557 akobayashi[@]eps.s.u-tokyo.ac.jp
Laser Ablation-Plasma Ion Source Mass Spectrometer (LA-ICPMS)
Instrument # 9
Instrument: Thermo Fisher Scientific iCAP Q and Neptune Plus
Location: “ICP Mass Spectrometry Room”, B139, Centeral Bldg., Faculty of Science Bldg.1
Principle and Features: ICPMS is a mass spectrometer that ionizes elements with high-temperature argon plasma and divides the ions by mass by electric or magnetic field to determine the element concentration and isotope composition. Argon plasma has a very high temperature and can efficiently ionize most elements (other than rare gases and halogens). Furthermore, since the plasma ion source is under atmospheric pressure, this device can be combined with various sample injection methods. By combining with the laser ablation method, trace element concentrations and isotope composition of solid samples such as minerals and glass can be determined with high spatial resolution (~ 10 µm).
Manager: Akihiro Kobayashi Tel: 24557 akobayashi[@]eps.s.u-tokyo.ac.jp
Sample and Material
Sample and Material of Geography
Sample and material related to geography such as maps, aerial photographs are kept in the museum geography sample and material room. EPS students and faculty members have an access to domestic general map, domestic thematic map, aerial photographs, etc., with exceptions of some valuable antique maps, geological samples, coral samples and folkloristic samples.
INO’s Map (“Chuzu”) Restoration Project
With the support of the Sumitomo Foundation’s cultural property maintainance and restoration project, EPS Departmenthas conducted the INO’s Map (7 maps) restoration project over 4 years from Fiscal Year 2015 (2015: Eastern and Western Hokkaido, 2016: Tohoku and Chubu, 2017: Chugoku and Shikoku, 2018: Northern and Southern Kyushu).
→ Report on INO’s Map Restoration Project
Transfer of INO’s Map (Feb. 19, 2018)
Feb. 19, 2018
Transfer of Material
On January 31, 2018, following material was officially transfterred to the Department of Earth and Planetary Science from the University Museum, the University of Tokyo.
伊能中図 (INO’s Map “Chuzu”)