Department of Earth and Planetary Science

Analytical field-emission scanning electron microscope (FE-SEM)

Common Use Facilities: 4
Analytical field-emission scanning electron microscope
 JEOL JSM-7000F

Location:
B238 Central Wing, Faculty of Science Bldg. 1

Administrator:
Mr Yoshida Tel: 24528 yoshida[@]eps.s.u-tokyo.ac.jp

 FE-SEM